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CBPR1000 Series Roughness and Contour Measuring Instrument

Item No.:



Description Item specifics
Features: 
Standard model, lower cost,
digital contour detector.
Equipped with standard no guide head roughness detector.
Integrated instrument for roughness, wide range contour measurement.


Technical Specification:
 
Model No.   CBPR1000 CBPR2000
Column Range 320 ~ 620 mm
Drive unit Range 100 ~ 200 mm
Indicating accuracy[1] ± (1+2L/100) μm ± (0.8+2L/100) μm
Straightness[2] ≤0.8 μm / 100 mm ≤0.5 μm / 100 mm
Contour Detector Range 0 ~ ± 20 mm
Indicating accuracy[3] ± (1.3+6 |H| /100) μm ± (0.6+5 |H| /100) μm
Resolution 0.01 ~ 0.2 μm
Roughness Detector Range ± 300 μm ± 500 μm
Range resolution ratio 1:65536 1:262144
Indicating accuracy ≤ ± (7nm+ 3.5%) ≤ ± (5nm+ 3.5%)
Repeatability[4] 1σ≤2 nm 1σ≤1 nm
Contour Accuracy Arc[5] ≤ ± (2+ R/8) μm ≤ ± (1.5+ R/12) μm
Angle[6] ≤ ± 2' ≤ ± 1'
Roughness Accuracy Residual noise[7] ≤ 10 nm ≤ 5 nm
Drive Speed X axis (horizontal direction) 0.1 ~ 10 mm/s 0.05 ~ 15 mm/s
Z axis (column) 0.5 ~ 10 mm/s 0.2 ~ 15 mm/s
Contour Measurement Function Workpiece surface line feature, point feature, distance between points,distance between lines. Position accuracy of each features,including distance,parallelism,verticality,angle,groove depth,groove width,radius,anslysis for straight line accuracy,convexity and contour.
Roughness Measurement Function Roughness Function:Ra, Rp, Rv, Rz, Rz(jis), R3z, RzDIN, Rzj, Rmax, Rc, Rt, Rq, Rsk, Rku, Rsm,Rs, R△q, Rk, Rpk, Rvk, Mr1, Mr2, Rmr Waveness Parameter:Wa, Wt, Wp, Wv, Wz, Wq, Wsm, Wsk, Wku, WmrOriginal Contour Parameter:Pa, Pt, Pp, Pv, Pz, Pq, Psm, Psk, Pku, Pmr
[1]:  (L: measuring length)
[2]:  (λc is 2.5mm, optical flat sampling speed≤0.3mm/s.)
[3]:  (H: measuring height)
[4]:  (measuring with square wave standard gauge block, Ra is 0.35 ~ 0.5μm.)
[5]:  (R: standard ball, 2mm<R<10mm,sampling arc angle is 120°.)
[6]:  (60° and 90° angle block gauge,sampling angle edge length is 5mm.)
[7]:  (λc is 0.08mm, optical flat sampling speed 0.1mm/s.)


Application:

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